Functional testing techniques for digital LSI/VLSI systems
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Stephen Y. H. Su, Tonysheng Lin
Functional testing techniques for digital LSI/VLSI systems
DAC, 1984.

DAC 1984
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@inproceedings{DAC-1984-SuL,
	acmid         = "800848",
	author        = "Stephen Y. H. Su and Tonysheng Lin",
	booktitle     = "{Proceedings of the 21st Design Automation Conference}",
	isbn          = "0-8186-0542-1",
	pages         = "517--528",
	publisher     = "{ACM/IEEE}",
	title         = "{Functional testing techniques for digital LSI/VLSI systems}",
	year          = 1984,
}

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