Wojciech Maly
Optimal order of the VLSI IC testing sequence
DAC, 1986.
@inproceedings{DAC-1986-Maly, author = "Wojciech Maly", booktitle = "{Proceedings of the 23rd Design Automation Conference}", doi = "10.1145/318013.318103", pages = "560--566", publisher = "{IEEE Computer Society Press}", title = "{Optimal order of the VLSI IC testing sequence}", year = 1986, }