Jaushin Lee, Janak H. Patel
Hierarchical Test Generation under Intensive Global Functional Constraints
DAC, 1992.
@inproceedings{DAC-1992-LeeP,
acmid = "113938.149433",
author = "Jaushin Lee and Janak H. Patel",
booktitle = "{Proceedings of the 29th Design Automation Conference}",
isbn = "0-8186-2822-7",
pages = "261--266",
publisher = "{IEEE Computer Society Press}",
title = "{Hierarchical Test Generation under Intensive Global Functional Constraints}",
year = 1992,
}