J. W. McPherson
Reliability challenges for 45nm and beyond
DAC, 2006.
@inproceedings{DAC-2006-McPherson,
author = "J. W. McPherson",
booktitle = "{Proceedings of the 43rd Design Automation Conference}",
doi = "10.1145/1146909.1146959",
isbn = "1-59593-381-6",
pages = "176--181",
publisher = "{ACM}",
title = "{Reliability challenges for 45nm and beyond}",
year = 2006,
}











