@inproceedings{DAC-2008-ElmWIZLM,
	author        = "Melanie Elm and Hans-Joachim Wunderlich and Michael E. Imhof and Christian G. Zoellin and Jens Leenstra and Nicolas Mäding",
	booktitle     = "{Proceedings of the 45th Design Automation Conference}",
	doi           = "10.1145/1391469.1391680",
	isbn          = "978-1-60558-115-6",
	pages         = "828--833",
	publisher     = "{ACM}",
	title         = "{Scan chain clustering for test power reduction}",
	year          = 2008,
}