Juan Antonio Maestro, Pedro Reviriego
Study of the effects of MBUs on the reliability of a 150 nm SRAM device
DAC, 2008.
@inproceedings{DAC-2008-MaestroR,
author = "Juan Antonio Maestro and Pedro Reviriego",
booktitle = "{Proceedings of the 45th Design Automation Conference}",
doi = "10.1145/1391469.1391704",
isbn = "978-1-60558-115-6",
pages = "930--935",
publisher = "{ACM}",
title = "{Study of the effects of MBUs on the reliability of a 150 nm SRAM device}",
year = 2008,
}











