Ivo Schanstra, A. J. van de Goor
Consequences of RAM Bitline Twisting for Test Coverage
DATE, 2003.
@inproceedings{DATE-2003-SchanstraG,
acmid = "1022907",
author = "Ivo Schanstra and A. J. van de Goor",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2003.10052",
isbn = "0-7695-1870-2",
pages = "11176--11177",
publisher = "{IEEE Computer Society}",
title = "{Consequences of RAM Bitline Twisting for Test Coverage}",
year = 2003,
}