Ghenadie Bodean, Diana Bodean, A. Labunetz
New Schemes for Self-Testing RAM
DATE, 2005.
@inproceedings{DATE-2005-BodeanBL,
author = "Ghenadie Bodean and Diana Bodean and A. Labunetz",
booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2005.223",
isbn = "0-7695-2288-2",
pages = "858--859",
publisher = "{IEEE Computer Society}",
title = "{New Schemes for Self-Testing RAM}",
year = 2005,
}











