Eric Liau, Doris Schmitt-Landsiedel
Computational Intelligence Characterization Method of Semiconductor Device
DATE, 2005.
@inproceedings{DATE-2005-LiauS, author = "Eric Liau and Doris Schmitt-Landsiedel", booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2005.100", isbn = "0-7695-2288-2", pages = "456--461", publisher = "{IEEE Computer Society}", title = "{Computational Intelligence Characterization Method of Semiconductor Device}", year = 2005, }