Tsu-Wei Tseng, Jin-Fu Li, Da-Ming Chang
A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap
DATE, 2006.
@inproceedings{DATE-2006-TsengLC,
author = "Tsu-Wei Tseng and Jin-Fu Li and Da-Ming Chang",
booktitle = "{Proceedings of the 10th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1131498",
pages = "53--58",
publisher = "{European Design and Automation Association, Leuven, Belgium}",
title = "{A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap}",
year = 2006,
}