Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. Reddy
Improving compressed test pattern generation for multiple scan chain failure diagnosis
DATE, 2009.
@inproceedings{DATE-2009-TangGCR,
author = "Xun Tang and Ruifeng Guo and Wu-Tung Cheng and Sudhakar M. Reddy",
booktitle = "{Proceedings of the 13th Conference on Design, Automation and Test in Europe}",
pages = "1000--1005",
publisher = "{IEEE}",
title = "{Improving compressed test pattern generation for multiple scan chain failure diagnosis}",
year = 2009,
}