Mingjing Chen, Alex Orailoglu
Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme
DATE, 2010.
@inproceedings{DATE-2010-ChenO,
author = "Mingjing Chen and Alex Orailoglu",
booktitle = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
pages = "63--68",
publisher = "{IEEE}",
title = "{Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme}",
year = 2010,
}











