Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme
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Mingjing Chen, Alex Orailoglu
Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme
DATE, 2010.

DATE 2010
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@inproceedings{DATE-2010-ChenO,
	author        = "Mingjing Chen and Alex Orailoglu",
	booktitle     = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
	pages         = "63--68",
	publisher     = "{IEEE}",
	title         = "{Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme}",
	year          = 2010,
}

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