Melanie Elm, Hans-Joachim Wunderlich
BISD: Scan-based Built-In self-diagnosis
DATE, 2010.
@inproceedings{DATE-2010-ElmW,
author = "Melanie Elm and Hans-Joachim Wunderlich",
booktitle = "{Proceedings of the 14th Conference on Design, Automation and Test in Europe}",
pages = "1243--1248",
publisher = "{IEEE}",
title = "{BISD: Scan-based Built-In self-diagnosis}",
year = 2010,
}