Correlating models and silicon for improved parametric yield
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Rob Aitken, Greg Yeric, D. Flynn
Correlating models and silicon for improved parametric yield
DATE, 2011.

DATE 2011
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@inproceedings{DATE-2011-AitkenYF,
	author        = "Rob Aitken and Greg Yeric and D. Flynn",
	booktitle     = "{Proceedings of the 15th Conference on Design, Automation and Test in Europe}",
	isbn          = "978-1-61284-208-0",
	pages         = "1159--1163",
	publisher     = "{IEEE}",
	title         = "{Correlating models and silicon for improved parametric yield}",
	year          = 2011,
}

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