@inproceedings{DATE-2012-HaronH,
	acmid         = "2492906",
	author        = "Nor Zaidi Haron and Said Hamdioui",
	booktitle     = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-1-4577-2145-8",
	pages         = "799--804",
	publisher     = "{IEEE}",
	title         = "{DfT schemes for resistive open defects in RRAMs}",
	year          = 2012,
}