@inproceedings{DATE-2012-SinghNL,
	acmid         = "2492772",
	author        = "Padmaraj Singh and Vijaykrishnan Narayanan and David L. Landis",
	booktitle     = "{Proceedings of the 16th Conference and Exhibition on Design, Automation and Test in Europe}",
	isbn          = "978-1-4577-2145-8",
	pages         = "256--259",
	publisher     = "{IEEE}",
	title         = "{Hazard driven test generation for SMT processors}",
	year          = 2012,
}