Josef Kinseher, Leonhard Heis, Ilia Polian
Analyzing the effects of peripheral circuit aging of embedded SRAM architectures
DATE, 2017.
@inproceedings{DATE-2017-KinseherHP,
author = "Josef Kinseher and Leonhard Heis and Ilia Polian",
booktitle = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2017.7927106",
isbn = "978-3-9815370-8-6",
pages = "852--857",
publisher = "{IEEE}",
title = "{Analyzing the effects of peripheral circuit aging of embedded SRAM architectures}",
year = 2017,
}