Josef Kinseher, Leonhard Heis, Ilia Polian
Analyzing the effects of peripheral circuit aging of embedded SRAM architectures
DATE, 2017.
@inproceedings{DATE-2017-KinseherHP,
	author        = "Josef Kinseher and Leonhard Heis and Ilia Polian",
	booktitle     = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2017.7927106",
	isbn          = "978-3-9815370-8-6",
	pages         = "852--857",
	publisher     = "{IEEE}",
	title         = "{Analyzing the effects of peripheral circuit aging of embedded SRAM architectures}",
	year          = 2017,
}