@inproceedings{DATE-2017-LiHLLJ,
	author        = "Tianjian Li and Yan Han and Xiaoyao Liang and Hsien-Hsin S. Lee and Li Jiang 0002",
	booktitle     = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2017.7927050",
	isbn          = "978-3-9815370-8-6",
	pages         = "560--565",
	publisher     = "{IEEE}",
	title         = "{Fault clustering technique for 3D memory BISR}",
	year          = 2017,
}