Rei Ueno, Naofumi Homma, Sumio Morioka, Takafumi Aoki
Automatic generation of formally-proven tamper-resistant Galois-field multipliers based on generalized masking scheme
DATE, 2017.
@inproceedings{DATE-2017-UenoHMA,
author = "Rei Ueno and Naofumi Homma and Sumio Morioka and Takafumi Aoki",
booktitle = "{Proceedings of the 21st Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2017.7927133",
isbn = "978-3-9815370-8-6",
pages = "978--983",
publisher = "{IEEE}",
title = "{Automatic generation of formally-proven tamper-resistant Galois-field multipliers based on generalized masking scheme}",
year = 2017,
}