Charalampos Antoniadis, Dimitrios Garyfallou, Nestor E. Evmorfopoulos, Georgios I. Stamoulis
EVT-based worst case delay estimation under process variation
DATE, 2018.
@inproceedings{DATE-2018-AntoniadisGES,
author = "Charalampos Antoniadis and Dimitrios Garyfallou and Nestor E. Evmorfopoulos and Georgios I. Stamoulis",
booktitle = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2018.8342220",
isbn = "978-3-9819263-0-9",
pages = "1333--1338",
publisher = "{IEEE}",
title = "{EVT-based worst case delay estimation under process variation}",
year = 2018,
}