EVT-based worst case delay estimation under process variation
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Charalampos Antoniadis, Dimitrios Garyfallou, Nestor E. Evmorfopoulos, Georgios I. Stamoulis
EVT-based worst case delay estimation under process variation
DATE, 2018.

DATE 2018
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@inproceedings{DATE-2018-AntoniadisGES,
	author        = "Charalampos Antoniadis and Dimitrios Garyfallou and Nestor E. Evmorfopoulos and Georgios I. Stamoulis",
	booktitle     = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2018.8342220",
	isbn          = "978-3-9819263-0-9",
	pages         = "1333--1338",
	publisher     = "{IEEE}",
	title         = "{EVT-based worst case delay estimation under process variation}",
	year          = 2018,
}


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