Thomas Haine, Johan Segers, Denis Flandre, David Bol
Gradient importance sampling: An efficient statistical extraction methodology of high-sigma SRAM dynamic characteristics
DATE, 2018.
@inproceedings{DATE-2018-HaineSFB,
author = "Thomas Haine and Johan Segers and Denis Flandre and David Bol",
booktitle = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2018.8342002",
isbn = "978-3-9819263-0-9",
pages = "195--200",
publisher = "{IEEE}",
title = "{Gradient importance sampling: An efficient statistical extraction methodology of high-sigma SRAM dynamic characteristics}",
year = 2018,
}