Daniel Kraak, Innocent Agbo, Mottaqiallah Taouil, Said Hamdioui, Pieter Weckx, Stefan Cosemans, Francky Catthoor
Degradation analysis of high performance 14nm FinFET SRAM
DATE, 2018.
@inproceedings{DATE-2018-KraakATHWCC,
author = "Daniel Kraak and Innocent Agbo and Mottaqiallah Taouil and Said Hamdioui and Pieter Weckx and Stefan Cosemans and Francky Catthoor",
booktitle = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2018.8342003",
isbn = "978-3-9819263-0-9",
pages = "201--206",
publisher = "{IEEE}",
title = "{Degradation analysis of high performance 14nm FinFET SRAM}",
year = 2018,
}
