Sarath Mohanachandran Nair, Rajendra Bishnoi, Mehdi Baradaran Tahoori
Parametric failure modeling and yield analysis for STT-MRAM
DATE, 2018.
@inproceedings{DATE-2018-NairBT,
author = "Sarath Mohanachandran Nair and Rajendra Bishnoi and Mehdi Baradaran Tahoori",
booktitle = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2018.8342016",
isbn = "978-3-9819263-0-9",
pages = "265--268",
publisher = "{IEEE}",
title = "{Parametric failure modeling and yield analysis for STT-MRAM}",
year = 2018,
}