In-growth test for monolithic 3D integrated SRAM
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Pu Pang, Yixun Zhang, Tianjian Li, Sung Kyu Lim, Quan Chen, Xiaoyao Liang, Li Jiang 0002
In-growth test for monolithic 3D integrated SRAM
DATE, 2018.

DATE 2018
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@inproceedings{DATE-2018-PangZLLCLJ,
	author        = "Pu Pang and Yixun Zhang and Tianjian Li and Sung Kyu Lim and Quan Chen and Xiaoyao Liang and Li Jiang 0002",
	booktitle     = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2018.8342071",
	isbn          = "978-3-9819263-0-9",
	pages         = "569--572",
	publisher     = "{IEEE}",
	title         = "{In-growth test for monolithic 3D integrated SRAM}",
	year          = 2018,
}


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