Pu Pang, Yixun Zhang, Tianjian Li, Sung Kyu Lim, Quan Chen, Xiaoyao Liang, Li Jiang 0002
In-growth test for monolithic 3D integrated SRAM
DATE, 2018.
@inproceedings{DATE-2018-PangZLLCLJ,
author = "Pu Pang and Yixun Zhang and Tianjian Li and Sung Kyu Lim and Quan Chen and Xiaoyao Liang and Li Jiang 0002",
booktitle = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2018.8342071",
isbn = "978-3-9819263-0-9",
pages = "569--572",
publisher = "{IEEE}",
title = "{In-growth test for monolithic 3D integrated SRAM}",
year = 2018,
}