NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI
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Ajith Sivadasan, Riddhi Jitendrakumar Shah, Vincent Huard, Florian Cacho, Lorena Anghel
NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI
DATE, 2018.

DATE 2018
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@inproceedings{DATE-2018-SivadasanSHCA,
	author        = "Ajith Sivadasan and Riddhi Jitendrakumar Shah and Vincent Huard and Florian Cacho and Lorena Anghel",
	booktitle     = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2018.8342154",
	isbn          = "978-3-9819263-0-9",
	pages         = "997--998",
	publisher     = "{IEEE}",
	title         = "{NBTI aged cell rejuvenation with back biasing and resulting critical path reordering for digital circuits in 28nm FDSOI}",
	year          = 2018,
}


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