Fabian Speicher, Jonas Meier, Soheil Aghaie, Ralf Wunderlich, Stefan Heinen
AMS verification methodology regarding supply modulation in RF SoCs induced by digital standard cells
DATE, 2018.
@inproceedings{DATE-2018-SpeicherMAWH,
author = "Fabian Speicher and Jonas Meier and Soheil Aghaie and Ralf Wunderlich and Stefan Heinen",
booktitle = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2018.8342087",
isbn = "978-3-9819263-0-9",
pages = "633--636",
publisher = "{IEEE}",
title = "{AMS verification methodology regarding supply modulation in RF SoCs induced by digital standard cells}",
year = 2018,
}