AMS verification methodology regarding supply modulation in RF SoCs induced by digital standard cells
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Fabian Speicher, Jonas Meier, Soheil Aghaie, Ralf Wunderlich, Stefan Heinen
AMS verification methodology regarding supply modulation in RF SoCs induced by digital standard cells
DATE, 2018.

DATE 2018
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@inproceedings{DATE-2018-SpeicherMAWH,
	author        = "Fabian Speicher and Jonas Meier and Soheil Aghaie and Ralf Wunderlich and Stefan Heinen",
	booktitle     = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.23919/DATE.2018.8342087",
	isbn          = "978-3-9819263-0-9",
	pages         = "633--636",
	publisher     = "{IEEE}",
	title         = "{AMS verification methodology regarding supply modulation in RF SoCs induced by digital standard cells}",
	year          = 2018,
}


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