Saru Vig, Guiyuan Jiang, Siew-Kei Lam
Dynamic skewed tree for fast memory integrity verification
DATE, 2018.
@inproceedings{DATE-2018-VigJL,
author = "Saru Vig and Guiyuan Jiang and Siew-Kei Lam",
booktitle = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2018.8342089",
isbn = "978-3-9819263-0-9",
pages = "642--647",
publisher = "{IEEE}",
title = "{Dynamic skewed tree for fast memory integrity verification}",
year = 2018,
}











