Saru Vig, Guiyuan Jiang, Siew-Kei Lam
Dynamic skewed tree for fast memory integrity verification
DATE, 2018.
@inproceedings{DATE-2018-VigJL, author = "Saru Vig and Guiyuan Jiang and Siew-Kei Lam", booktitle = "{Proceedings of the 22nd Conference and Exhibition on Design, Automation and Test in Europe}", doi = "10.23919/DATE.2018.8342089", isbn = "978-3-9819263-0-9", pages = "642--647", publisher = "{IEEE}", title = "{Dynamic skewed tree for fast memory integrity verification}", year = 2018, }