Anteneh Gebregiorgis, Mehdi Baradaran Tahoori
Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability
DATE, 2019.
@inproceedings{DATE-2019-GebregiorgisT,
author = "Anteneh Gebregiorgis and Mehdi Baradaran Tahoori",
booktitle = "{Proceedings of the 23rd Conference and Exhibition on Design, Automation and Test in Europe}",
doi = "10.23919/DATE.2019.8714898",
isbn = "978-3-9819263-2-3",
pages = "1028--1033",
publisher = "{IEEE}",
title = "{Test Pattern Generation for Approximate Circuits Based on Boolean Satisfiability}",
year = 2019,
}