Janusz Rajski, Kan Thapar
Nanometer Design: What are the Requirements for Manufacturing Test?
DATE, 2004.
@inproceedings{DATE-v2-2004-RajskiT,
author = "Janusz Rajski and Kan Thapar",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe, Volume 2}",
doi = "10.1109/DATE.2004.1269010",
isbn = "0-7695-2085-5",
pages = "930--937",
publisher = "{IEEE Computer Society}",
title = "{Nanometer Design: What are the Requirements for Manufacturing Test?}",
year = 2004,
}











