Depth from physics: physics-based image analysis and feature definition
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David Hattery, Murray H. Loew
Depth from physics: physics-based image analysis and feature definition
ICPR, 1998.

ICPR 1998
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@inproceedings{ICPR-1998-HatteryL,
	author        = "David Hattery and Murray H. Loew",
	booktitle     = "{Proceedings of the 14th International Conference on Pattern Recognition}",
	doi           = "10.1109/ICPR.1998.711243",
	isbn          = "0-8186-8512-3",
	pages         = "711--713",
	publisher     = "{IEEE Computer Society}",
	title         = "{Depth from physics: physics-based image analysis and feature definition}",
	year          = 1998,
}

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