David Hattery, Murray H. Loew
Depth from physics: physics-based image analysis and feature definition
ICPR, 1998.
@inproceedings{ICPR-1998-HatteryL,
author = "David Hattery and Murray H. Loew",
booktitle = "{Proceedings of the 14th International Conference on Pattern Recognition}",
doi = "10.1109/ICPR.1998.711243",
isbn = "0-8186-8512-3",
pages = "711--713",
publisher = "{IEEE Computer Society}",
title = "{Depth from physics: physics-based image analysis and feature definition}",
year = 1998,
}











