Michael Trummer, Christoph Munkelt, Joachim Denzler
Online Next-Best-View Planning for Accuracy Optimization Using an Extended E-Criterion
ICPR, 2010.
@inproceedings{ICPR-2010-TrummerMD, author = "Michael Trummer and Christoph Munkelt and Joachim Denzler", booktitle = "{Proceedings of the 20th International Conference on Pattern Recognition}", doi = "10.1109/ICPR.2010.406", isbn = "978-0-7695-4109-9", pages = "1642--1645", publisher = "{IEEE Computer Society}", title = "{Online Next-Best-View Planning for Accuracy Optimization Using an Extended E-Criterion}", year = 2010, }