Wei Li, Zelin Shi, Jian Yin
A Fully Affine Invariant Feature detector
ICPR, 2012.
@inproceedings{ICPR-2012-LiSY,
author = "Wei Li and Zelin Shi and Jian Yin",
booktitle = "{Proceedings of the 21st International Conference on Pattern Recognition}",
isbn = "978-1-4673-2216-4",
pages = "2768--2771",
publisher = "{IEEE Computer Society}",
title = "{A Fully Affine Invariant Feature detector}",
year = 2012,
}











