Zonglin Zhou, Stan Z. Li, Kap Luk Chan
A Theoretical Justification of Nearest Feature Line Method
ICPR, 2000.
@inproceedings{ICPR-v2-2000-ZhouLC,
author = "Zonglin Zhou and Stan Z. Li and Kap Luk Chan",
booktitle = "{Proceedings of the 15th International Conference on Pattern Recognition, Volume 2}",
doi = "10.1109/ICPR.2000.906185",
isbn = "0-7695-0750-6",
pages = "2759--2762",
publisher = "{IEEE Computer Society}",
title = "{A Theoretical Justification of Nearest Feature Line Method}",
year = 2000,
}