A Theoretical Justification of Nearest Feature Line Method
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Zonglin Zhou, Stan Z. Li, Kap Luk Chan
A Theoretical Justification of Nearest Feature Line Method
ICPR, 2000.

ICPR v2 2000
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@inproceedings{ICPR-v2-2000-ZhouLC,
	author        = "Zonglin Zhou and Stan Z. Li and Kap Luk Chan",
	booktitle     = "{Proceedings of the 15th International Conference on Pattern Recognition, Volume 2}",
	doi           = "10.1109/ICPR.2000.906185",
	isbn          = "0-7695-0750-6",
	pages         = "2759--2762",
	publisher     = "{IEEE Computer Society}",
	title         = "{A Theoretical Justification of Nearest Feature Line Method}",
	year          = 2000,
}


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