Takahiro Sugiyama, Keiichi Abe
Edge Detection Method Based on Edge Reliability with Fixed Thresholds: Consideration of Uniformity and Gradation
ICPR, 2000.
@inproceedings{ICPR-v3-2000-SugiyamaA, author = "Takahiro Sugiyama and Keiichi Abe", booktitle = "{Proceedings of the 15th International Conference on Pattern Recognition, Volume 3}", doi = "10.1109/ICPR.2000.903630", isbn = "0-7695-0750-6", pages = "3660--3663", publisher = "{IEEE Computer Society}", title = "{Edge Detection Method Based on Edge Reliability with Fixed Thresholds: Consideration of Uniformity and Gradation}", year = 2000, }