Takahiro Sugiyama, Keiichi Abe
Edge Detection Method Based on Edge Reliability with Fixed Thresholds: Consideration of Uniformity and Gradation
ICPR, 2000.
@inproceedings{ICPR-v3-2000-SugiyamaA,
author = "Takahiro Sugiyama and Keiichi Abe",
booktitle = "{Proceedings of the 15th International Conference on Pattern Recognition, Volume 3}",
doi = "10.1109/ICPR.2000.903630",
isbn = "0-7695-0750-6",
pages = "3660--3663",
publisher = "{IEEE Computer Society}",
title = "{Edge Detection Method Based on Edge Reliability with Fixed Thresholds: Consideration of Uniformity and Gradation}",
year = 2000,
}











