Anil K. Jain, Xiaowei Xu, Tin Kam Ho, Fan Xiao
Uniformity Testing Using Minimal Spanning Tree
ICPR, 2002.
@inproceedings{ICPR-v4-2002-JainXHX,
author = "Anil K. Jain and Xiaowei Xu and Tin Kam Ho and Fan Xiao",
booktitle = "{Proceedings of the 16th International Conference on Pattern Recognition, Volume 4}",
doi = "10.1109/ICPR.2002.1047451",
isbn = "0-7695-1695-5",
pages = "281--284",
publisher = "{IEEE Computer Society}",
title = "{Uniformity Testing Using Minimal Spanning Tree}",
year = 2002,
}











