Uniformity Testing Using Minimal Spanning Tree
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Anil K. Jain, Xiaowei Xu, Tin Kam Ho, Fan Xiao
Uniformity Testing Using Minimal Spanning Tree
ICPR, 2002.

ICPR v4 2002
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@inproceedings{ICPR-v4-2002-JainXHX,
	author        = "Anil K. Jain and Xiaowei Xu and Tin Kam Ho and Fan Xiao",
	booktitle     = "{Proceedings of the 16th International Conference on Pattern Recognition, Volume 4}",
	doi           = "10.1109/ICPR.2002.1047451",
	isbn          = "0-7695-1695-5",
	pages         = "281--284",
	publisher     = "{IEEE Computer Society}",
	title         = "{Uniformity Testing Using Minimal Spanning Tree}",
	year          = 2002,
}

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