Anil K. Jain, Xiaowei Xu, Tin Kam Ho, Fan Xiao
Uniformity Testing Using Minimal Spanning Tree
ICPR, 2002.
@inproceedings{ICPR-v4-2002-JainXHX, author = "Anil K. Jain and Xiaowei Xu and Tin Kam Ho and Fan Xiao", booktitle = "{Proceedings of the 16th International Conference on Pattern Recognition, Volume 4}", doi = "10.1109/ICPR.2002.1047451", isbn = "0-7695-1695-5", pages = "281--284", publisher = "{IEEE Computer Society}", title = "{Uniformity Testing Using Minimal Spanning Tree}", year = 2002, }