Ajitha Rajan, Michael W. Whalen, Mats Per Erik Heimdahl
The effect of program and model structure on mc/dc test adequacy coverage
ICSE, 2008.
@inproceedings{ICSE-2008-RajanWH,
author = "Ajitha Rajan and Michael W. Whalen and Mats Per Erik Heimdahl",
booktitle = "{Proceedings of the 30th International Conference on Software Engineering}",
doi = "10.1145/1368088.1368111",
editor = "Wilhelm Schäfer and Matthew B. Dwyer and Volker Gruhn",
isbn = "978-1-60558-079-1",
pages = "161--170",
publisher = "{ACM}",
title = "{The effect of program and model structure on mc/dc test adequacy coverage}",
year = 2008,
}











