Tony Fountain, Thomas G. Dietterich, Bill Sudyka
Mining IC test data to optimize VLSI testing
KDD, 2000.
@inproceedings{KDD-2000-FountainDS,
author = "Tony Fountain and Thomas G. Dietterich and Bill Sudyka",
booktitle = "{Proceedings of the Sixth International Conference on Knowledge Discovery and Data Mining}",
doi = "10.1145/347090.347099",
isbn = "1-58113-233-6",
pages = "18--25",
publisher = "{ACM}",
title = "{Mining IC test data to optimize VLSI testing}",
year = 2000,
}











