Yan Liu, Pei-yun Hseuh, Rick Lawrence, Steve Meliksetian, Claudia Perlich, Alejandro Veen
Latent graphical models for quantifying and predicting patent quality
KDD, 2011.
@inproceedings{KDD-2011-LiuHLMPV,
author = "Yan Liu and Pei-yun Hseuh and Rick Lawrence and Steve Meliksetian and Claudia Perlich and Alejandro Veen",
booktitle = "{Proceedings of the 17th International Conference on Knowledge Discovery and Data Mining}",
doi = "10.1145/2020408.2020586",
isbn = "978-1-4503-0813-7",
pages = "1145--1153",
publisher = "{ACM}",
title = "{Latent graphical models for quantifying and predicting patent quality}",
year = 2011,
}