Syed Waseem Haider, João W. Cangussu
Bayesian Estimation of Defects based on Defect Decay Model: BayesED3M
SEKE, 2006.
@inproceedings{SEKE-2006-HaiderC,
author = "Syed Waseem Haider and João W. Cangussu",
booktitle = "{Proceedings of the 18th International Conference on Software Engineering and Knowledge Engineering}",
isbn = "1-891706-18-7",
pages = "256--261",
title = "{Bayesian Estimation of Defects based on Defect Decay Model: BayesED3M}",
year = 2006,
}