Travelled to:1 × France
1 × Republic of China
1 × Spain
1 × USA
Collaborated with:K.P.Chan T.Y.Chen T.Y.Chen
Talks about:random (4) test (4) restrict (2) techniqu (1) overhead (1) paramet (1) control (1) reduct (1) normal (1) filter (1)
Person: Dave Towey
DBLP: Towey:Dave
Contributed to:
20072005
20042003Wrote 4 papers:
- SEKE-2007-ChanCT #parametricity #random testing #strict #testing
- Controlling Restricted Random Testing: An Examination of the Exclusion Ratio Parameter (KPC, TYC, DT), pp. 163–166.
- SEKE-2005-ChanCT #adaptation #random testing #reduction #testing
- Adaptive Random Testing with Filtering: An Overhead Reduction Technique (KPC, TYC, DT), pp. 292–299.
- AdaEurope-2004-ChanCT #random testing #testing
- Good Random Testing (KPC, TYC, DT), pp. 200–212.
- AdaEurope-2003-ChanCT #normalisation #random testing #strict #testing
- Normalized Restricted Random Testing (KPC, TYC, DT), pp. 368–381.