Travelled to:
2 × USA
Collaborated with:
A.Chandrakasan S.Narendra D.Antoniadis
Talks about:
size (2) transistor (1) threshold (1) technolog (1) hierarch (1) discharg (1) pattern (1) mutual (1) mtcmos (1) exclus (1)
Person: James Kao
DBLP: Kao:James
Contributed to:
Wrote 2 papers:
- DAC-1998-KaoNC
- MTCMOS Hierarchical Sizing Based on Mutual Exclusive Discharge Patterns (JK, SN, AC), pp. 495–500.
- DAC-1997-KaoCA #multi
- Transistor Sizing Issues and Tool For Multi-Threshold CMOS Technology (JK, AC, DA), pp. 409–414.