Travelled to:1 × Germany
1 × Japan
Collaborated with:O.Krasotkina V.Mottl
Talks about:recognit (2) bayesian (2) problem (2) pattern (2) concept (2) drift (2) approach (1) regress (1) logist (1) under (1)
Person: Pavel A. Turkov
DBLP: Turkov:Pavel_A=
Contributed to:
2012
2012Wrote 2 papers:
- ICPR-2012-TurkovKM #concept #pattern matching #pattern recognition #problem #recognition
- The Bayesian logistic regression in pattern recognition problems under concept drift (PAT, OK, VM), pp. 2976–2979.
- MLDM-2012-TurkovKM #approach #concept #pattern matching #pattern recognition #problem #recognition
- Bayesian Approach to the Concept Drift in the Pattern Recognition Problems (PAT, OK, VM), pp. 1–10.