Collaborated with:
C.Chien Runliang Dou Ying-Jen Chen Chia-Cheng Chen
Talks about:
semiconductor (1) manufactur (1) collinear (1) parametr (1) enhanc (1) yield (1) model (1) wat (1)
Person: Peng-Chieh Lee
DBLP: Lee:Peng=Chieh
Contributed to:
Wrote 1 papers:
- CASE-2017-ChienLDCC #modelling #parametricity
- Modeling collinear WATs for parametric yield enhancement in semiconductor manufacturing (CFC, PCL, RD, YJC, CCC), pp. 739–743.