Travelled to:
1 × USA
Collaborated with:
J.Park K.Park M.Baeg
Talks about:
transform (1) photometr (1) invari (1) featur (1) scale (1) sift (1)
Person: Seung-Ho Baeg
DBLP: Baeg:Seung=Ho
Contributed to:
Wrote 1 papers:
- ICPR-2008-ParkPBB #invariant #named
- pi-SIFT: A photometric and Scale Invariant Feature Transform (JHP, KWP, SHB, MB), pp. 1–4.