Travelled to:
1 × USA
Collaborated with:
Y.Kim T.Kim G.Lee Y.Jang M.Kim
Talks about:
test (2) industri (1) softwar (1) concol (1) embed (1) autom (1) unit (1) larg (1) use (1)
Person: Youil Kim
DBLP: Kim:Youil
Contributed to:
Wrote 1 papers:
- ASE-2013-KimKKLJK #automation #embedded #industrial #scalability #testing #using
- Automated unit testing of large industrial embedded software using concolic testing (YK, YK, TK, GL, YJ, MK), pp. 519–528.