Venkatesh-Prasad Ranganath, Pradip Vallathol, Pankaj Gupta
Compatibility testing using patterns-based trace comparison
ASE, 2014.
@inproceedings{ASE-2014-RanganathVG,
author = "Venkatesh-Prasad Ranganath and Pradip Vallathol and Pankaj Gupta",
booktitle = "{Proceedings of the 29th IEEE/ACM International Conference on Automated Software Engineering}",
doi = "10.1145/2642937.2642942",
isbn = "978-1-4503-3013-8",
pages = "469--478",
publisher = "{ACM}",
title = "{Compatibility testing using patterns-based trace comparison}",
year = 2014,
}











