Venkatesh-Prasad Ranganath, Pradip Vallathol, Pankaj Gupta
Compatibility testing using patterns-based trace comparison
ASE, 2014.
@inproceedings{ASE-2014-RanganathVG, author = "Venkatesh-Prasad Ranganath and Pradip Vallathol and Pankaj Gupta", booktitle = "{Proceedings of the 29th IEEE/ACM International Conference on Automated Software Engineering}", doi = "10.1145/2642937.2642942", isbn = "978-1-4503-3013-8", pages = "469--478", publisher = "{ACM}", title = "{Compatibility testing using patterns-based trace comparison}", year = 2014, }