Compatibility testing using patterns-based trace comparison
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Venkatesh-Prasad Ranganath, Pradip Vallathol, Pankaj Gupta
Compatibility testing using patterns-based trace comparison
ASE, 2014.

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@inproceedings{ASE-2014-RanganathVG,
	author        = "Venkatesh-Prasad Ranganath and Pradip Vallathol and Pankaj Gupta",
	booktitle     = "{Proceedings of the 29th IEEE/ACM International Conference on Automated Software Engineering}",
	doi           = "10.1145/2642937.2642942",
	isbn          = "978-1-4503-3013-8",
	pages         = "469--478",
	publisher     = "{ACM}",
	title         = "{Compatibility testing using patterns-based trace comparison}",
	year          = 2014,
}

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