Real-time trust evaluation in integrated circuits
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Yier Jin, Dean Sullivan
Real-time trust evaluation in integrated circuits
DATE, 2014.

DATE 2014
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@inproceedings{DATE-2014-JinS,
	author        = "Yier Jin and Dean Sullivan",
	booktitle     = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}",
	doi           = "10.7873/DATE.2014.104",
	pages         = "1--6",
	publisher     = "{IEEE}",
	title         = "{Real-time trust evaluation in integrated circuits}",
	year          = 2014,
}

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