Yier Jin, Dean Sullivan
Real-time trust evaluation in integrated circuits
DATE, 2014.
@inproceedings{DATE-2014-JinS, author = "Yier Jin and Dean Sullivan", booktitle = "{Proceedings of the 18th Conference and Exhibition on Design, Automation and Test in Europe}", doi = "10.7873/DATE.2014.104", pages = "1--6", publisher = "{IEEE}", title = "{Real-time trust evaluation in integrated circuits}", year = 2014, }