Automated test generation for Debugging arithmetic circuits
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Farimah Farahmandi, Prabhat Mishra 0001
Automated test generation for Debugging arithmetic circuits
DATE, 2016.

DATE 2016
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@inproceedings{DATE-2016-FarahmandiM,
	author        = "Farimah Farahmandi and Prabhat Mishra 0001",
	booktitle     = "{Proceedings of the 20th Conference and Exhibition on Design, Automation and Test in Europe}",
	ee            = "http://ieeexplore.ieee.org/document/7459519/",
	isbn          = "978-3-9815-3707-9",
	pages         = "1351--1356",
	publisher     = "{IEEE}",
	title         = "{Automated test generation for Debugging arithmetic circuits}",
	year          = 2016,
}


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