Edward Kim, Shruthika Vangala
Deep Action Unit classification using a binned intensity loss and semantic context model
ICPR, 2016.
@inproceedings{ICPR-2016-KimV,
author = "Edward Kim and Shruthika Vangala",
booktitle = "{Proceedings of the 23rd International Conference on Pattern Recognition}",
doi = "10.1109/ICPR.2016.7900282",
isbn = "978-1-5090-4847-2",
pages = "4136--4141",
publisher = "{IEEE}",
title = "{Deep Action Unit classification using a binned intensity loss and semantic context model}",
year = 2016,
}
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