Reinhard Klette, Ben Yip
Evaluation of Curve Length Measurements
ICPR, 2000.
@inproceedings{ICPR-v1-2000-KletteY, author = "Reinhard Klette and Ben Yip", booktitle = "{Proceedings of the 15th International Conference on Pattern Recognition, Volume 1}", doi = "10.1109/ICPR.2000.905411", isbn = "0-7695-0750-6", pages = "1610--1613", publisher = "{IEEE Computer Society}", title = "{Evaluation of Curve Length Measurements}", year = 2000, }