Reinhard Klette, Ben Yip
Evaluation of Curve Length Measurements
ICPR, 2000.
@inproceedings{ICPR-v1-2000-KletteY,
author = "Reinhard Klette and Ben Yip",
booktitle = "{Proceedings of the 15th International Conference on Pattern Recognition, Volume 1}",
doi = "10.1109/ICPR.2000.905411",
isbn = "0-7695-0750-6",
pages = "1610--1613",
publisher = "{IEEE Computer Society}",
title = "{Evaluation of Curve Length Measurements}",
year = 2000,
}











